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• 12:03, 6 September 2022 Admin talk contribs deleted page Kelvin probe force microscope (content was: "{{short description|Noncontact variant of atomic force microscopy}} thumb|400px|In Kelvin probe force microscopy, a conducting cantilever is scanned over a surface at a constant height in order to map the work function of the surface. File:SKP Typical Instrument.jpg|alt=Scanning Kelvin probe instrument|thumb|A typical scanning Kelvin probe (SKP) instrument. On the left is the control unit with lock-in amplifier and backing potential...")